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Semiconductor Material and Device Characterization

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Click here to buy Semiconductor Material and Device Characterization by  Dieter K. Schroder. Semiconductor Material and Device Characterization
by Dieter K. Schroder
Sales Rank: 421015
5.0 out of 5 stars
$116.76
At Amazon
on 9-11-2008.
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Features
  • Cover Type: Hard Cover with 800 pages
  • Published by: Wiley-IEEE Press
  • Edition: 3rd Edition January 30, 2006
  • Written in: English
  • ISBN 10 Number: 0471739065
  • ISBN 13 Number: 978-0471739067
  • Book Dimensions: 9.4 x 6.3 x 1.6 inches
  • Weighs: 2.6 pounds


Reader Reviews
This is an essential text for engineers, scientists, and graduate students working in the semiconductor field. It contains a thorough review of all major electrical, optical, and physical characterization methods that are commonly used. Descriptions of techniques are generally conceptually oriented, clearly stated, and do not rely excessively on equations. In addition, many useful figures are included to help explain concepts when introduced. Up to date references are included for essentially every technique mentioned. Comment | | (Report this)


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Semiconductor Material and Device Characterization
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Price: $116.76
Updated on 9-11-2008.
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