Features
- Cover Type: Hard Cover with 282 pages
- Published by: Oxford University Press, USA February 21, 2002
- Written in: English
- ISBN 10 Number: 019850618X
- ISBN 13 Number: 978-0198506188
-
Book Dimensions:
9.2 x 6.1 x 0.9 inches
- Weighs: 1.2 pounds
Product Review
Graduate students, lecturers, and professionals in crystallography, solid state chemistry, condensed matter physics, structural biology, and materials science, will find the thrust of this book exciting Professionals in the field would be morally and professionally remiss if they failed to read, consult and discuss this volume with students and colleagues. Amongst several features contributing towards making the book an important acquisition are: comprehensive and up-to-date character; emphasis on practical aspects of the topic; inclusion of many worked examples and problems; and an abundance of illustrative material throughout. Current Engineering Practice perhaps the most comprehensive and easy to use introduction to fundamental theory and techniques of structure analysis by X-ray diffraction, to appear from the world's scientific and technical publishing to date. It will be an invaluable reference to X-ray crystallographers, practitioners of X-ray analysis and all those involved in materials characterization. Current Engineering Practice This textbook should definitely be considered for use in introductory courses in X-ray structure determination as it provides a good framework for course organization. The concise treatment of the material (all of small-molecule X-ray crystallography in 265 pages) will work well when supplemented with lectures and additional class discussions. Acta Crystallographica The book is very well written, has an great organization of material and is filled with many illustrative examples of the subject matter. Acta Crystallographica
Product Review
"Explains the theory and methods behind the techniques of x-ray scattering structure analysis of crystals. Downplaying, but not eliminating, the mathematics involved, chapters discuss: crystal growth, evaluation, and mounting; symmetry and space group determination, data collection using four-circle diffractometers, area detectors, Fourier syntheses, structure determination by Patterson methods, direct methods of crystal structure determination, maximum entropy, least-squares fitting of parameters, structure refinement, the derivation and interpretation of results, the crystallographic information file, and crystallographic databases. Originating in an intensive course in x-ray structure analysis organized on behalf of the Chemical Crystallography Group of the British Crystallographic Association, this text assumes basic knowledge of crystal structure determination."--SciTech Book News
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