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Defects in SiO2 and Related Dielectrics: Science and Technology (Nato Science Series II: Mathematics, Physics and...

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Click here to buy Defects in SiO2 and Related Dielectrics: Science and Technology (Nato Science Series II: Mathematics, Physics and... by  Gianfranco Pacchioni, Linards Skuja, and David L. Griscom. Defects in SiO2 and Related Dielectrics: Science and Technology (Nato Science Series II: Mathematics, Physics and...
by Gianfranco Pacchioni, Linards Skuja, and David L. Griscom
Sales Rank: 5157275
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$299.00
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Features
  • Cover Type: Hard Cover with 632 pages
  • Published by: Springer
  • Edition: 1st Edition November 2000
  • Written in: English
  • ISBN 10 Number: 0792366859
  • ISBN 13 Number: 978-0792366850
  • Book Dimensions: 9.2 x 6.4 x 1.5 inches
  • Weighs: 2.4 pounds

Product Description
Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies.
This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.


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Defects in SiO2 and Related Dielectrics: Science and Technology (Nato Science Series II: Mathematics, Physics and...
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