High-Energy Electron Diffraction and Microscopy (Monographs on the Physics and Chemistry of Materials, 61)

Features

• Cover Type: Hard Cover with 560 pages
• Published by: Oxford University Press, USA March 11, 2004
• Written in: English
• ISBN 10 Number: 0198500742
• ISBN 13 Number: 978-0198500742
• Book Dimensions: 9.3 x 6.1 x 1.4 inches
• Weighs: 2.4 pounds

Product Review

"Peng (electronics, Peking University) provides materials scientists with a theoretical basis for the interpretation of experiments using electron microscopy, electron diffraction, and associated spectroscopic techniques. Covering theoretical treatments of both transmission and reflection diffraction by high-energy electronics within a common framework and addressing the relationship between them, he looks at the various theoretical tools available for the elucidation of electron-solid interactions, the propagation of high- energy electrons in crystals, and the interpretation of experimental results. Some of the theoretical tools examined have been developed during the last ten to twenty years." --SciTech Book News
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Product Description
This book provides the reader with a comprehensive introduction to high-energy electron diffraction and elastic and in elastic scattering of high-energy electrons, with particular emphasis on application to modern electron microscopy. Starting from a survey of fundamental phenomena, we introduce the most important concepts underlying modern understanding of high-energy electron diffraction. Dynamical diffraction in transmission (THEED) and reflection (RHEED) geometries is treated using a general matrix theory, where computer programs and worked examples are provided to illustrate the concepts and to familiarize the reader with practical applications. Diffuse and inelastic scattering and coherence effects are treated comprehensively both as a perturbation of elastic scattering and within the general multiple scattering quantum mechanical framework or the density matrix method. Among the highlights are the treatment of resonance diffraction of electrons, HOLZ diffraction, the formation of Kikuchi bands and lines and ring patterns, and application of diffraction to monitoring of growing surfaces. Useful practical data are summarized in tables including those of electron scattering factors for all neutral atoms and many ions, and the temperature dependent Debye-Waller factors given for over 100 elemental crystals and compounds.