Positron Annihilation in Semiconductors: Defect Studies (Springer Series in Solid-State Sciences)

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	Positron Annihilation in Semiconductors: Defect Studies (Springer Series in Solid-State Sciences)
	by Reinhard Krause-Rehberg and Hartmut Leipner Sales Rank: 2422773	$193.00 At Amazon on 11-10-2008.

*Features* Cover Type: Hard Cover with 379 pages Published by: Springer; Corrected edition May 21, 2003 Written in: English ISBN 10 Number: 3540643710 ISBN 13 Number: 978-3540643715 Book Dimensions: 9.5 x 6.5 x 0.8 inches Weighs: 1.5 pounds *Product Description* The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation. A comprehensive review is given of the different positron techniques, whose application to various kinds of defects, e.g. vacancies, impurity-vacancy complexes and dislocations, is described. The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods. The most prominent results obtained with positrons in practically all important semiconductors are reviewed. A special chapter of the book deals with positron annihilation as a promising tool for many technological purposes. The theoretical background necessary to understand the experimental results is explained in detail. Back To Top
Positron Annihilation in Semiconductors: Defect Studies (Springer Series in Solid-State Sciences) ~~List Price: $193.00~~ Available from Amazon Price: $193.00 Updated on 11-10-2008.

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