Transmission Electron Microscopy and Diffractometry of Materials

Features

• Cover Type: Hard Cover with 770 pages
• Published by: Springer
• Edition: 2nd Edition March 14, 2005
• Written in: English
• ISBN 10 Number: 3540437649
• ISBN 13 Number: 978-3540437642
• Book Dimensions: 9.4 x 6.4 x 1.3 inches
• Weighs: 2.6 pounds

Product Review


"I can warmly recommend this book, which is attractively priced, as an great addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques."
(John Hutchison in Journal of Microscopy)
"I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization."
(Ray Egerton in Micron)
"A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience."
(John C. H. Spence, Arizona State University)
"I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending this book for my course. It is a superb book."
(Colin Humphries, Cambridge University)
"This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. Highly recommended."
(Ronald Gronsky, University of California, Berkeley)

From the reviews of the second edition:

"Transmission Electron Microscopy and Diffractometry of Materials has only been out since 2001 … but so well has it sold that B. Fultz and J. Howe have already produced a revised edition, the revisions ‘ranging from substantial re-structuring to subtle rewording’. … I must insist that this text represents an enormous amount of work, it is densely filled, well-illustrated and carefully organized. It should be on a shelf in all electron microscopy laboratories … ." (Ultramicroscopy, Vol. 99, 2004)

"The book by Fultz and Howe, now in its second edition, is part of a programme of advanced texts covering topics of current and emerging interest in physics. … Each chapter is accompanied by several problems suitable for a written examination. The contents are very comprehensive … . My impression is that the book will serve as a useful reference work, as well as a core textbook for graduate students." (Professor L. M. Brown, Contemporary Physics, Vol. 44 (6), 2003)

"The main objective of the present book is teaching. … Each chapter concludes with a number of problems to be solved by students. Furthermore the appendix contains valuable information in the form of tables and graphs, and also practical hints for daily laboratory work, which might be useful for accreditation procedures. The book can be highly recommended … ." (W. Oesterle, Werkstoffe und Korrosion, Issue 9, 2003)

Product Description
This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. It explains the uniqueness of each technique, especially imaging and spectroscopy in the TEM. Simple citations of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Numerous problems are provided at the end of each chapter to reinforce key concepts, and solutions are available to instructors. Appendices provide procedures for introductory laboratory exercises, and up-to-date tabulations of physical data useful for TEM and XRD.

Reader Reviews
This book is concise and comprehensive. Own it if you want to master TEM.