High-Resolution Electron Microscopy for Materials Science

Features

• Cover Type: Paperback with 190 pages
• Published by: Springer-Verlag Telos January 15, 1999
• Written in: English
• ISBN 10 Number: 4431702342
• ISBN 13 Number: 978-4431702344
• Book Dimensions: 10.5 x 7.5 x 0.5 inches
• Weighs: 1.4 pounds

Product Description
High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.

Language Notes
Text: English (translation)
Original Language: Japanese