Transmission Electron Microscopy and Diffractometry of Materials

Features

• Cover Type: Hard Cover with 758 pages
• Published by: Springer
• Edition: 3rd Edition December 4, 2007
• Written in: English
• ISBN 10 Number: 3540738851
• ISBN 13 Number: 978-3540738855
• Book Dimensions: 9.4 x 6.1 x 1.3 inches
• Weighs: 2.6 pounds

Product Review


"I can warmly recommend this book, which is attractively priced, as an great addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques."
(John Hutchison in Journal of Microscopy)
"I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization."
(Ray Egerton in Micron)
"A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience."
(John C. H. Spence, Arizona State University)
"I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending this book for my course. It is a superb book."
(Colin Humphries, Cambridge University)
"This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. Highly recommended."
(Ronald Gronsky, University of California, Berkeley)

From the reviews of the second edition:

"Transmission Electron Microscopy and Diffractometry of Materials has only been out since 2001 … but so well has it sold that B. Fultz and J. Howe have already produced a revised edition, the revisions ‘ranging from substantial re-structuring to subtle rewording’. … I must insist that this text represents an enormous amount of work, it is densely filled, well-illustrated and carefully organized. It should be on a shelf in all electron microscopy laboratories … ." (Ultramicroscopy, Vol. 99, 2004)

"The book by Fultz and Howe, now in its second edition, is part of a programme of advanced texts covering topics of current and emerging interest in physics. … Each chapter is accompanied by several problems suitable for a written examination. The contents are very comprehensive … . My impression is that the book will serve as a useful reference work, as well as a core textbook for graduate students." (Professor L. M. Brown, Contemporary Physics, Vol. 44 (6), 2003)

"The main objective of the present book is teaching. … Each chapter concludes with a number of problems to be solved by students. Furthermore the appendix contains valuable information in the form of tables and graphs, and also practical hints for daily laboratory work, which might be useful for accreditation procedures. The book can be highly recommended … ." (W. Oesterle, Werkstoffe und Korrosion, Issue 9, 2003) --This text refers to the Hardcover edition.

Product Description


This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM. This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. The book explains the basics of how waves and wave functions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Reader Reviews
This review is from: Transmission Electron Microscopy and Diffractometry of Materials (Hardcover) This book is concise and comprehensive. Own it if you want to master TEM.